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  • 3D Optical Profilometry service in NIMAC
    Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Dual Beam FIB DB FIB Electron Backscatter Diffraction EBSD Cathode Luminescence CL

    Original URL path: http://www.electronmicroscopy.ie/opticalprofilometry.htm (2016-02-16)
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  • Variable Angle Spectroscopic Ellipsometry (VASE) service in NIMAC
    Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Dual Beam FIB DB FIB Electron Backscatter Diffraction EBSD Cathode

    Original URL path: http://www.electronmicroscopy.ie/vase.htm (2016-02-16)
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  • X-ray diffraction (XRD) service in NIMAC
    Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Dual Beam FIB DB FIB Electron Backscatter Diffraction EBSD Cathode Luminescence CL Small angle X ray

    Original URL path: http://www.electronmicroscopy.ie/xrd.htm (2016-02-16)
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  • Fourier Transform Infrared (FTIR) service in NIMAC
    Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Dual Beam FIB DB FIB Electron Backscatter Diffraction EBSD Cathode Luminescence CL Small angle

    Original URL path: http://www.electronmicroscopy.ie/ftir.htm (2016-02-16)
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  • UV-Vis Spectroscopy (UV-VIS) service in NIMAC
    Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Dual Beam FIB DB FIB Electron Backscatter Diffraction EBSD Cathode Luminescence CL Small angle

    Original URL path: http://www.electronmicroscopy.ie/uvvis.htm (2016-02-16)
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  • Atomic Force Microscope (AFM) service in NIMAC
    Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Dual Beam FIB DB FIB Electron Backscatter Diffraction EBSD Cathode Luminescence CL Small angle

    Original URL path: http://www.electronmicroscopy.ie/afm.htm (2016-02-16)
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  • Nano Structures service in NIMAC
    STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Electron Backscatter Diffraction EBSD Cathode Luminescence CL Small angle X ray scattering SAXS TEM Service SEM Service EM service Electron Microscopy service FIB service material analysis surface analysis analytical service company Europe america Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures

    Original URL path: http://www.electronmicroscopy.ie/nanostructures.htm (2016-02-16)
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  • TEM analysis service in NIMAC
    DualBeam FIB capability Quality Product and failure analysis of materials Identification of foreign material on a nanometer scale Thickness measurements on nanometer thin films Crystallographic information TEM Analysis Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron

    Original URL path: http://www.electronmicroscopy.ie/temservice.htm (2016-02-16)
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