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  • Focused Ion Beam (FIB) service UK & Ireland, semiconductor failure analysis
    cross sections up to 50 microns in depth Large samples accomadated FIB Analysis Service Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS

    Original URL path: http://www.electronmicroscopy.ie/fib.htm (2016-02-16)
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  • Scanning Electron Microscopy service UK & Ireland - SEM analysis
    resolution FEG SEM Large sample capability 6cm in diameter Wide varietly of sample analysis capabilites SEM Service Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy

    Original URL path: http://www.electronmicroscopy.ie/sem.htm (2016-02-16)
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  • X-Ray Photoelectron Spectroscopy (XPS / ESCA) ,UK & Ireland, surface analysis
    Soon in 2010 October Chemical information on the first 5 10nm XPS Analysis Service Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS

    Original URL path: http://www.electronmicroscopy.ie/xps.htm (2016-02-16)
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  • Electron Microscopy service in NIMAC
    Electron Backscatter Diffraction EBSD Scanning Transmission Electron Microscopy STEM Cathode Luminescence CL Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM Analysis DB FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam

    Original URL path: http://www.electronmicroscopy.ie/electronmicroscopy.htm (2016-02-16)
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  • Imaging service in NIMAC
    Quick Focused Ion Beam FIB Variable Voltage DualBeam FIB TEM sample Prep X Sections Atomic Force Microscope AFM Elemental Imaging EDX mapping Elemental mapping WDS mapping Elemental mapping Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM Analysis DB FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical

    Original URL path: http://www.electronmicroscopy.ie/imaging.htm (2016-02-16)
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  • Material Analysis service in NIMAC
    X Ray Diffraction XRD Global crystal information Fourier Transform Infa Red FTIR Chemical information UV Vis Spectroscopy UV VIS Light Absorbtion Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM Analysis DB FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis NIMAC Scanning Transmission Electron

    Original URL path: http://www.electronmicroscopy.ie/materialanalysis.htm (2016-02-16)
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  • Surface Analysis service in NIMAC
    Focused Ion Beam FIB Variable Voltage DualBeam FIB TEM sample Prep X Sections 3D Optical Profilometry Non contact surface profiling information Electron Backscatter Diffraction EBSD Site specfic crystal structure information Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM Analysis DB FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL

    Original URL path: http://www.electronmicroscopy.ie/surfaceanalysis.htm (2016-02-16)
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  • Cross Section service in NIMAC
    FIB Variable Voltage DualBeam FIB TEM sample Prep X Sections Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM Analysis DB FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning

    Original URL path: http://www.electronmicroscopy.ie/crosssections.htm (2016-02-16)
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