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  • Electron Microscopy Ireland specialist in SEM, TEM, FIB & XPS analysis: NIMAC
    Microscopy TEM HR TEM Analysis Dual Beam FIB DB FIB Product Failure analysis Focused Ion Beam FIB Sub surface information Scanning Electron Microscopy SEM Surface analysis X Ray Photoelectron Spectroscopy XPS ESCA Chemical Services Electron Microscopy Link Imaging Link Material Analysis Link Surface Analysis Link FIB TEM Cross Sections Link Particle Analysis Link Circuit Edits Link NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB

    Original URL path: http://www.electronmicroscopy.ie/ (2016-02-16)
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  • Analytical Techniques NIMAC UCD
    Microscopy STEM Cathode Luminescence CL 3D Optical Profilometry 3D OP Variable Angle Spectroscopic Ellipsometry VASE Coming Soon X Ray Photoelectron Spectroscopy XPS X Ray Diffraction XRD Fourier Transform Infa Red FTIR Surface area and pore size analyser UV Vis Spectroscopy UV VIS Particle size analyser Atomic Force Microscope AFM NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy

    Original URL path: http://www.electronmicroscopy.ie/techniques.htm (2016-02-16)
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  • Services Experts in Product and Material Analysis
    of our clients Electron Microscopy EM Imaging I Material Analysis MA Surface Analysis SA FIB TEM Cross Sections CS Particle Analysis PA Nano Structures NS Circuit Edits CE Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM Analysis DB FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical

    Original URL path: http://www.electronmicroscopy.ie/services.htm (2016-02-16)
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  • Sample Submission to Nano Imaging and Material Analysis Centre
    information to assist in the analysis or processing of samples Contact ian reid ucd ie for a quote or information regarding any of the services in the Nano Imaging and Material Analysis Centre Analytical Request Form NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS DualBeam FIB DB FIB Electron Backscatter Diffraction

    Original URL path: http://www.electronmicroscopy.ie/submission.htm (2016-02-16)
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  • News from the Nano Imaging and Material Analysis Experts
    NIMAC offical opening is on the 14th October 2009 Nanovation 14 8 09 NIMAC is now offering TEM analysis as a service which includes TEM sample preparation and imaging from bulk specimens 3 8 09 NIMAC has installed a turbo sputter coater with Chromium Cr as the target material Cr has a very small grain size compared to most other metals including Gold 11 5 09 UCD News Bulletin NIMAC

    Original URL path: http://www.electronmicroscopy.ie/news.htm (2016-02-16)
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  • Contact the Nano Imaging and Material Analysis Experts
    Nano Imaging and Material Analysis Centre NIMAC Chemical and Bioprocess Engineering University College Dublin Belfield Dublin 4 Ireland P 353 0 1 716 1724 F 353 0 1 716 1177 Map Location NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS DualBeam FIB DB FIB Electron Backscatter Diffraction EBSD Cathode Luminescence CL

    Original URL path: http://www.electronmicroscopy.ie/contact.htm (2016-02-16)
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  • Transmission Electron Microscopy service UK & Ireland- TEM analysis
    analysis capability Quality Product and failure analysis of a large variety of materials Bio Sminconductor metals nano particles Identification of foreign material on a nanometer scale Thickness measurements on nanometer thin films Crystallographic information TEM Analysis Service Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE

    Original URL path: http://www.electronmicroscopy.ie/tem.htm (2016-02-16)
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  • Dual Beam FIB (DB-FIB) service in NIMAC
    thin films DB FIB Service Services Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training Techniques Select TEM DB FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL NIMAC Scanning Transmission Electron Microscopy STEM Transmission Electron Microscopy TEM Focused Ion Beam FIB Scanning Electron Microscopy SEM Energy Dispersive Spectroscopy EDS EDX Wavelength Dispersive Spectroscopy WDS Dual Beam FIB DB

    Original URL path: http://www.electronmicroscopy.ie/dualbeamfib.htm (2016-02-16)
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